| A new Scanning Electron Microscopy with Polarization Analysis (SEMPA) has been developed at The University of Texas at Arlington (UT Arlington), Physics department and used to image the surface magnetic domain structure of permalloy thin films and 3% (weight %) Si-Fe sheets in a ultra-high vacuum system. A compact Mott electron-spin polarimeter (operating 25 keV) has been attached to the back of a hemispherical energy analyzer and two orthogonal in-plane components of the electron spin-polarization were measured with sub-micron resolution and excellent contrast. Saw-tooth domain structures and cross-tie domain walls in permalloy have been analyzed, and high resolution vector images of the direction distribution of magnetization have been presented. It is found that the cross-tie domain walls occur at special places where the variation of the magnetization across the domain boundary is between 140... |
