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Multi-factor reliability model: A Bayesian application to accelerated life testing

Posted on:2012-01-19Degree:Ph.DType:Dissertation
University:New Mexico State UniversityCandidate:Rodriguez, Manuel IFull Text:PDF
GTID:1452390011456116Subject:Applied Mathematics
Abstract/Summary:
Reliability analysis for accelerated life testing (ALT) is a critical process performed to determine the life of a product. The main goal of ALT is to simulate use conditions of a manufactured product. The selection of the model is critical when life prediction is done for highly reliable products which have been exposed to this type of tests. Statisticians, mathematicians and engineers have developed life-stress relationship models that allow the analyst to extrapolate a use level probability density function from life data obtained at increased stress levels. These models describe the path of a particular life characteristic of the distribution from one stress level to another. The life characteristic can be any life measure expressed as a function of stress using different failure distributions. During this work, a flexible reliability model is presented. The model is capable to analyze more than 3 stresses at the same time during ALT tests. Also, the proposed model is capable to analyze the influence that other variables, which are not included in the test, have on the failure times.;Results show the proposed methodology works satisfactorily in reliability analysis for accelerated life testing, comparing those results generated by common existing models.
Keywords/Search Tags:Life, Reliability, Model, ALT
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