Instrument response function for scanning force microscopy and defects on mica induced by 50 keV argon ions

Radiation defects on muscovite mica surfaces bombarded by 50 keV Ar;Instrument response function for scanning probe microscopy was studied to assure the reliability of the experimental data. Improvements to the SFM techniques were made. A height calibration procedure on nano- and subnanometer scales was introduced and implemented. Also, the characteristic time-domain noise of the SFM was studied by using stationary tip images and discrete Fast Fourier Transform techniques. A...