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Fast 3-D Measurement Profilometry Based On Modulation Ratio

Posted on:2009-04-09Degree:MasterType:Thesis
Country:ChinaCandidate:N XuFull Text:PDF
GTID:2120360242974628Subject:Optical Engineering
Abstract/Summary:PDF Full Text Request
As a non-contact, rapid, reliable technique, optical 3-D profilometry has been widely used in many fields, such as machine vision, auto-manufacture, industrial online testing, object simulation and biomedicine. Based on modulation measurement profilometry(MMP) and digital image processing, a fast 3-D shape measurement method based on modulation ratio was presented.As a fast measurement method, it The contributions of this dissertation are as follows:1. The principle of the new 3-D shape measurement method based on modulation ratiowas described in detail. The method of getting modulation ratio, the relationship between modulation ratio and the height and the calibration of the measurement system were discussed.2. An experiment system for 3-D measurement profilometry based on modulationratio was designed and developed. The hardware of the system was selected, and the system parameters were confirmed.3. Several objects were measured to prove the system correct and effective.4. In order to improve the accuracy of the measurement, the source of error in thesystem was discussed. Several image denoising algorithms are used to improve the measuring accuracy, such as Hanning filter, wavelet analysis and image correction algorithms.
Keywords/Search Tags:3-D measurement, Modulation ratio, Image denoising, Wavelet analysis
PDF Full Text Request
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