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Research Of Temporal Speckle Pattern Interferometry

Posted on:2011-01-27Degree:MasterType:Thesis
Country:ChinaCandidate:X L ChenFull Text:PDF
GTID:2120360305971284Subject:Optical Engineering
Abstract/Summary:PDF Full Text Request
With the development of phase-shifting technique, computer, CCD, a variety of algorithms, speckle pattern interferometry has been widely used in the fields such as micro-deformation measurement, surface roughness analysis, stress and strain analysis, vibration analysis, nondestructive testing, etc. Compared with conventional phase-shifting electronic speckle pattern interferometry (ESPI), temporal speckle pattern interferometry (TSPI) has the advantages of determining the direction of the deformation, large measuring range and so on, therefore it has been-caused more concern in recent years. The devices of temporal speckle pattern interferometry have been built and several measuring experiments have been performed with it. The preliminary experimental results are presented.The main works of this paper are as following:1) The program used to collect speckle pattern, retrieve phase, unwrap phase are made. The object deformations of linear and nonlinear variation are simulated respectively.2) The devices of non-heterodyne and heterodyne temporal speckle pattern interferometry have been setup respectively. The object deformation and object vibration with low frequency are measured with these devices, and the measured results are presented.3) The relativity of heterodyne temporal speckle pattern interferometry and phase-shifting ESPI are studied, and the possibility that heterodyne temporal speckle pattern substitutes for phase-shifting ESPI is discussed.
Keywords/Search Tags:Speckle pattern interferometry, heterodyne interferometry, temporal speckle pattern interferometry, Fourier transform
PDF Full Text Request
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