The Design Of PT Secondary Voltage Drop Tester Based On μ'SP～(TM)

With the increasing development of the market reform in Electric Power System, the high accuracy of electrical measurement is needed. There exits a compound error problem in the electrical measurement , which is composed of PT synthetic error, CT synthetic error, electrical energy measurement error and secondary potential of PT. Among the above 4 errors, secondary potential of PT is obvious, So we must take some measures to decrease or exterminate the error.The paper presents an instrumentation for measuring the secondary of PT based on type single-chip processor.An on-line test instrumentation based on digital measurement technology is proposed. The instrumentation adopts difference measurement theory, which can give direct benefits to measure secondary potential of PT. The instrumentation is composed of Analogue circuits and digital circuits. The test equipment is centered on type micro- processor. The methods of choice of components and design rules are presented and analyzed respectively.The instrumentation for measuring secondary potential has such merits as high velocity, high precision, simple operation on site. So it's recommendable in Power system. At the same it is also proved feasible that the type Single-chip processor processing data fleetly.