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Research And Develop For Measurement X-Ray Spectrum System In High-Speed Way

Posted on:2006-08-03Degree:MasterType:Thesis
Country:ChinaCandidate:X H HuFull Text:PDF
GTID:2132360155472473Subject:Instrument Science and Technology
Abstract/Summary:PDF Full Text Request
Both the Industrial Computed Tomography (ICT) and Medical Computed Tomography (MCT) are based on the radial testing. The ray source of X-ray ICT emits the mulit-spectrum X-ray which results in the X-ray beam hardening after interacting with materials and the corresponding CT image Cupping artifacts. Under this circumstance, the spectrum of X-ray can be measured by spectrum tester, if we can get and compare the difference of X-ray spectrum before and after interacting with all kinds of material, the CT images can be partially remedied. The goal of this dissertation is to process and analyze a fast X-ray spectrum measurement system based on PCI bus. In order to implement the high-speed spectrum measurement and data analysis, the PCI bus is chosed as the interface of this X-ray spectrum system. First, plenty of X-ray spectrum measurement documents and materials were analyzed and compared in order to prove our scheme theoretically; Second, the CMOS devices were the key parts for filtering, amplifying and Max Amplitude Detecting of the detecters'analog outputs; Third, the low power assumption and fast A/D devices were chosed to implement the 4096 channels detecting; Fourth we not only designed the timing control of sytem circuit, but also completed the control of the Max Amplitude Circuit based on the CPLD; Fifth, in order to complete high-speed data transfer between the PCI local bus and Double Ram, the PCI bus with PCI 9030 chip was our first choice. Meanwhile, for the purpose of development time reduction, much of our research and development, including PCI bus design, X-ray spectrum data test and system hardware debugging, were all based on the PLX 's PCI9030 Development Package. We also chosed the Hyperlynx software of Mentor Corporation to perform analysis of high-speed signals integrality on PCB board, which improved the circuit's stability remarkably. After hardware designing, the driver of system via DriverStudio and Visual C++ had been done, so that the circuit could be implantable and embedded for future system. At the same time, some signal processing for our X-ray spectrum data were completed, such as display smoothing, Max finding and power scale. In this dissertation, the performance of our measurement system was tested; the results showed that the system can satisfied the X-ray spectrum measurement request. In the last we also proposed the updating of the system for future work.
Keywords/Search Tags:Industrial X-CT, X-Ray Beam Hardening, A/D Converter, PCI Bus, CPLD, X-Spectrum Analysis
PDF Full Text Request
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