| System reliability analysis is the important content and base of Reliability Engineering. By analyzing the reliability of the system, it can evaluate the designing performance of the system and offer valuable reference and basic for improving and optimizing devices. Fault Tree Analysis, Fault Modes and Effects Analysis and Reliability Block Diagram are the popular methods for the system analysis. They are suitable for the simple system or are only capable of analyzing the reliability of steady-state system. The GO methodology is a system reliability analysis method oriented by success. It can analyze the reliability of the multi-state, related-time, complicated systems. Therefore, studying the theory and application of GO methodology is of important academic meaning and practical value.This paper introduces the basic principles of the GO methodology. It explains the basic concept of the GO methodology, and presents a quantitive algorithm for calculating the state probabilities of shared signals. Then it makes out the reliability analyzing process of the GO methodology by a practical example.This paper researches the GO method of the repairable closed-loop system by the theory of Markov processes and the method is validated by virtue of a simple example. This method can solve the reliability analysis on the system of feedback signal, and ulteriorly consummate and develop the GO theory and arithmetic.This paper designs the GO methodology reliability analysis software. It provides a designed requirement of GO methodology reliability analysis system. In addition to the software frame, the actualizing methods are presented in detail. This software elementarily realizes the GO method analysis.This paper analyzes the experiment system of electronic antiskid devices using the improved GO methodology. It calculates the reliability parameters and all the minimal cut set of the experiment system of electronic antiskid device. The reliability analysis results are important for improving the reliability of the current system, and offer academic basis for the fault diagnosis of the experiment... |