The Study Of Spectrum Resolving Of EDXRF Based On The Wavelet Theory

Energy-dispersive X-Ray Fluorescence is one of the physical analytical technology, which uses the radial of radicalized isotope source or X-ray pipe to radiate the measured sample to emit X-ray fluorescence, and the quantity of the radiance of the X-ray fluorescence decides the quantity of the measured element. It has the characteristic of measuring quickly,field work,low cost,portable instrument etc. Now it is widely used in geography,the inspection of nocuous material and on-line measure. However, the characteristic X-ray peaks are overlapped owing to low energy resolving power of the detector, which affects the measure precision owing to the interfering of the characteristic X-ray peaks, and sometimes it even can not analyze the quantity of elements. The technology of X-ray spectrum analysis is a mathematic method, which can get more information from the spectrum. It has a great significance to improve the instrument's analysis precision.The study originates from the National Geological Research Department's project 'the research and demonstration of the field EDXRF' (number: 1212010560204). This paper uses the recently developed wavelet transform to analyze the Energy-dispersive X-ray spectrum. Using it to smooth the spectrum and deduct the base, expatiate the feasibility of the method, process the practical spectrum and get a satisfying effect. As for the resolving of overlapping peaks, which is the important research project of X-ray fluorescence workers, the author has done abundant research. Propose the method of wavelet transform to search the intensity and numbers of the overlapped X-ray peaks, demonstrate the theory of the method and present the processing result of practical spectrum. A method based on the spline wavelet is presented to process the overlapped peaks of X-ray fluorescence spectrum. Compare with the original signal, the processed signal's peak intensity remain unaltered and the relative errors of peak area is less than±4%. Using the method to process the spectrum of the practical standard sample, the precision of the measure element of resolved spectrum is an improvement on unresolved spectrum, and attains a satisfying practical effect.Process the overlapped X-ray fluorescence spectrum with wavelet transform, which provides a new choice for resolving the overlapped X-ray fluorescence spectrum. And it also has an academic and practical guiding significance for wavelet transform to apply in this area.