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The Research On The Device Defect Diagnosis Method Based On Infrared Temperature Measurement

Posted on:2011-05-31Degree:MasterType:Thesis
Country:ChinaCandidate:J LinFull Text:PDF
GTID:2132360305987586Subject:High Voltage and Insulation Technology
Abstract/Summary:PDF Full Text Request
Infrared diagnostics is carried out in the power industry a broad means of detecting equipment failure, Its point of failure situation display image, intuitive, high accuracy, and power failure detection is not required, no sampling, no changing of equipment operating parameters, we can accurately determine equipment temperature and operating conditions or Defective the location and nature of the security operation to protect equipment. However, the analysis of infrared diagnostic techniques in the map of demanding, difficult, the author summed up according to the actual work experience, through the ASP technology to establish a new gallery of infrared temperature measurement, collect a large number of images measured, according to summarize a typical example of the fault type, be analyzed for future equipment failures to provide reference qualitative judgments, thereby enhancing the accuracy and efficiency of fault diagnosis.
Keywords/Search Tags:Infrared diagnostics, IR spectra, ASP technology, Typical example
PDF Full Text Request
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