Response Of Yeild And Quality Formation Of Wheat Cultivars With Different Heat Tolerance To High Temperature Stress

The experiment was carried out with four wheat cultivars (GC8901, SN1391, LM21, L95-7) at the experimental farm of Shandong Agricultural University from 2004 to 2005. Different stages and different degrees of high temperature stress experiments were done to study the response of yeild and quality formation of wheat cultivars with different heat tolerance to high temperature stress. The main results were as fallows:1. Effect of high temperature stress on grain yield and quality of wheatThe high temperature stress at flagging stage(T0) reduced the kernel number of per spike of GC8901 and SN1391 which is only about 50% of CK, the weight of per kernel of GC8901 significantly increased and was higher than CK, while that of SN 1391 was obviously lower than CK, these indicated that the two cultivars had different adaptive manner to T0. The high temperature stress from 8th to 9th days after anthesis (T1) decreased the 4 wheat cultivars'kernel number of per spike which fell by 10.36%～22.79% compared with CK. The 4 wheat cultivars'kernel number of per spike was also reduced by the high temperature stress from 15th to 16th after days after anthesis (T2), but the decreasing extent was lower than that of T1. The kernel weight of the 4 wheat cultivars after T1 and T2 treatments was obviously lower than CK, but it had different rules between T1 and T2 treatments, which demonstrated that different cultivars had different sensitive stages to high temperature stress after anthesis. The different degrees of high temperature stress was only carried out on GC8901 in middle grain filling stage, this treatment was executed from 15th to 18th days after anthesis(T3). The yield of T3 was...