The Research And Development Of Semiconductor Testing Equipment Based On Embedded Technology

This thesis described the research and development of semiconductor testing equipment that based on 32bits embedded microprocessor MCF5272 and the embedded operate system μClinux.Firstly, the development of embedded system, the advantage of using 32bits embedded microprocessor to develop semiconductor test equipment and the characters of embedded Operating System especially μClinux were introduced. The two familiar methods to debug embedded system, serial monitor and JTAG ICE debug tool, have been analysed, and the software-developing mode under the μClinux environment was introduced in detail as well.Secondly, the thesis described the functions and structure of discrete semiconductor testing equipment, and introduced in detail how to transform the high-speed bus of MCF5272 to the relatively low-speed bus both in hardware and software with the application of CPLD. The theory of high voltage generating in system was introduced, including the key points of high voltage circuit design and realization of function. The method of measure nA level leakage current and key points of hardware circuit design was discussed too.Finally, the software design of discrete semiconductor testing system was introduced, including the serial communication software design under μClinux environment, the protocol of communication between PC machine and testing system, and the resolve of byte align and byte ordering when store and read data in testing system memory. The method to store date in flash memory using JFFS file system was introduced, and the low-level control functions of testing system were introduced too.