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New Type Dc Parameters Automatic Test System Of VLSI

Posted on:2006-07-07Degree:MasterType:Thesis
Country:ChinaCandidate:X Y MaFull Text:PDF
GTID:2168360155460778Subject:Circuits and Systems
Abstract/Summary:PDF Full Text Request
DC parameters test is an important method of IC test.It is one of the key means to ensure the performances and qualities of IC. DC parameters test of IC is one of the supporting technologies developing IC industry. Consequently , DC parameters test of IC as a test class has been paid much attention to by many countries.With the development of IC industry, the size and the structure of IC enhanced quickly, DC parameters test of IC is more important. This paper gives the operating principle, implemental method and the superiority of new type DC parameters automatic test system of VLSI. The research in the paper is based on per pin parametric measurement unit AD5520 and instrumentation amplifier AD524, and focus on the software and the hardware of the DC parameters automatic test system of VLSI. This method has the advantage of compact structure and flexible programme mode. It is proved that the system has a high automatization, a high testing precision and good reliability. This paper is described in four parts as follows: Firstly, the operating principle of the DC parameters test is expatiated. We introduce the performances, the theory of operation and the advantage of the platform -per pin parametric measurement unit AD5520 and instrumentation amplifier AD524. Secondly, the hardware structure of the system is given. At first we introduce the A/D converter ,D/A converter ,analog multiplexers, PCI I/O card and CPLD we used in the system. Finally, the whole structure of the system is given. Thirdly, the working process of the system software is described. Using the tool of VC, we develop the test program and corresponding user interface to implement DC parameters automatic test system of VLSI. Fourthly, we describe the usage of DC parameters automatic test system of VLSI.
Keywords/Search Tags:DC parameters test, VLSI, per pin parametric measurement unit, instrumentation amplifier, CPLD
PDF Full Text Request
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