The Ionization Total Dose Radiation Effects And Hardening Techniques Of FPGA Microcircuit

The relation between electronic technology and radiation environment become increasing affinity.The large scale field programmable integration circuit FPGA is increasingly used in the domain of electronic,however the devices is epitaxial CMOS technology, the extent of damage need be carried on an investigation under y ionization total dose if the devices work under the badly radiation environment.First, radiation environment and radiation effects are introduced. Following,the article expatiates on the corresponding mechanism. It place emphasis on semiconductor material device and microcircuit. Ionization radiation, damage effects mechanism and hardened technology of the MOS technology configuration devices are investigated. Investigation content and investigation purpose are introduced.Secondly, basic knowledge about FPGA are briefly related.The paper places stress on the technology and specific configuration of Actel company FPGA chip.The process of using FPGA to exploit radiation sample is expatiated.The working current are selected as testing radiation parameter.and the experiment failure criterion is established.The FPGAchip A1280XL are exploited for radiation sample.These samples are radiated under y ionization total dose environment in three different radiation manner(dymatic bias voltage,interrupting dymatic bias voltage,no bias voltage).The mass of experiment data are gained through this test, subsequently the experiment data are analysed and dealt with.Last, the article discussed y ionization total dose effects of Actel company FPGA chip A1280XL in three different bias voltage manner. The chip radiation effects are analyzed for programmable chip inside structure.The damage law of FPGA device are found under y radiation environment, and available hardening techniques are introduced.The research of this article has got a lot of valuable data, which elementarily provide a firm foundation for the future work. The significance for improving hardening radiation of large scale integration circuit in theory foundation and realism measure.