Technology Of Random Test Based On Coverage Driven Verification

With the development of VLSI(Very Large Scale Integration), the integrity becomes larger and larger, from hundreds of thousand to millions or tens of millions, and it becomes more difficult to finish the verification task. It is also a big challenge to verification. How to finish the design and the verification task is a basilic problem for us within the limited R&D period. At present, many kinds of verification methods such as assertion verification, format verification, function verification are widely used in the actual engineering. In this thesis, the random test based on coverage drivern verification using the Specman E language is presented.This thesis focuses on one of the transport chips developed by Hisilicon optical network R&D department in the 2006, which is widely used in the huawei transport device with the operation frequence from 622MHz to 2.5GHz. It is designed with the 90nm technology of the IBM and contains about 20 million gates. It mainly processes 14 kinds of operation map into OTU1 operation and demaped from it, at the same time, monitors the overheads extracted from the operation and inserts them. 2 kinds of operations'verification task were taken charged. The verification of STM-1 transport direction, as an example, is presented to demonstrate the random test based on Coverage Driven Verification methodology and also with the building of the verification environment in this thesis. The process of the random test includes the making of the featurelist, test plan, checking part,process of random test, and the additional test part. And eventually, the complete verification-the ration of function coverage is 100%, is achieved.Now, the function verification of the circuit has already been completed. The simulation results show that the performances of the chip are excellent and can meet the functional specifications.