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Regulation Research Of Deposited Nanodot Structure Based On DPN

Posted on:2015-06-18Degree:MasterType:Thesis
Country:ChinaCandidate:Q DaiFull Text:PDF
GTID:2181330422991202Subject:Aviation Aerospace Manufacturing Engineering
Abstract/Summary:PDF Full Text Request
Surface modification technology with atomic force microscope(AFM) hasemerged and developed, which met the developmental requirements of nano-biology,nano-electronics and other disciplines. Dip pen nanolithography(DPN) is animportant technology in nanoscale surface modification. Since the birth of DPN,scholars have applied DPN to a variety of fields and explored the DPN mechanismfrom different angles. So far the regulation of deposited nanostructures’ scale andquality have been studied a little. This paper studied the shaping regulation ofdeposited nanodot.Theoretical model of the ink transportation between the AFM probe andsubstrate was founded based on fluid dynamics theory, which took the effects ofsurface tension and adhesion between substrate and ink into account. Ink flowprocess was simulated at both micron scale and nanoscale. The function of inkdiffusion radius on the substrate versus time and the function of ink diffusion radiuson the substrate versus substrate hydrophilicity were both gained.A new dipping pen method called tip approaching and fine tuning dipping wasproposed which was different from traditional dipping pen method which was calleddirectly-dipping-pen method. Nanodots were successfully created with approachingand fine tuning dipping-pen method under atmospheric humidity instead of highhumidity which was thought of a must by other researchers. A new experimentalprocedure was proposed which had a less stringent environmental requirementscompared with traditional DPN experiments. Experimental results were inagreement with the theoretical results, which verified the theoretical model.Quality formula of the deposited ink was deduced according to the function ofquality versus the resonance frequency. Requirement of system frequency resolutionwas calculated according to the quality formula and the experimental results. Tworegulation methods were proposed which were high-frequency continuous vibrationmethod and voltage regulation method. Finally, the regulation system was designedwhich provided a reference for future system.
Keywords/Search Tags:Atomic Force Microscope, Dip pen nanolithography, approaching andfine tuning dipping, regulation of nanodot deposition
PDF Full Text Request
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