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Research Of Heat Meter Metrology Techniques

Posted on:2015-04-05Degree:MasterType:Thesis
Country:ChinaCandidate:X J WangFull Text:PDF
GTID:2181330431995212Subject:Instrumentation engineering
Abstract/Summary:PDF Full Text Request
The development of the scanning tunneling microscope is introduced and the basic structure of the STM, basic principles of imaging strictly are introduced detailedly. Then the materials are polished under different conditions, using600heads sandpaper, polishing cloth and paper, gaining polished sample. Then the surface images of sample are got by using the scanning tunneling microscope. By using Offline Software of STM, the corresponding value of roughness of the image surface is got. And then, the rough changness of the image surface of analysis numbers are analyzed, and the curve of numerical. Finally according to the changed curve, the roughness impaction of the number of polishing and the changes of roughness are interpreted.
Keywords/Search Tags:physical polishing, roughness, scanning tunneling microscope
PDF Full Text Request
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