High Temperature Superconducting Thin Film Microwave Surface Resistance Test

In this paper the surface resistance of a single piece of HTS thin film is measured by using a TE01 mode sapphire resonator non-destructivity, at 77 K. By measuring the value of the resonator's quality factor, the microwave surface resistance R3 of tested sample can be determined. A new measuring method is presented, surface resistance can be calculated by Q= A + BR3. To measure 5O.8mm HTS thin film, a special sapphire resonator working at 12GHz is made and used. The method has advantages of nondestructivity, single sample, high Q value, high sensitivity, convenient experiment setup, small volume, and flexibility in operation.