Ccd Size Measurement Instrument Developed

To survey geometric dimension of the object precisely is applied widespread and valuable in the detection technology. The survey method with CCD(Charge Coupled Device ) has advantage over other methods because it is noncontact, accurate, easily handled by computer and connected with auto-controlled equipment. So we develop this CCD dimension survey device.This paper begins with basic principles to the device. Then it discusses detailedly the design of CCD photo system, the development of the HADC high-speed data acquisition card and it's driver, data process and edge detection etc. In the end, it gives master plan for CCD dimension survey device, adjustment for the results and deviation analysis.During the process of designing CCD dimension survey device, this paper mainly solve the following technical problem. Firstly, it discusses how to transform dimensional information of the undetected object into light signal. Secondly, it gives a method to turn light signal into electronic signal. Thirdly, it introduces how to acquisition electronic signal with dimensional information. The emphasis in the phase is on that the development of the driver for data acquisition card and turn light signal into data frame through the driver. Fourthly, it discusses how to process the data and edge detecting. In this phase, we discover that ISEF method is very good for edge detection, but all kinds of the CCD dimension survey device don't use this method. At the same time, we realize a kind of algorithm according the ISEF method. In the last, it introduces how to get result and adjust the result.