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Tdc Lcr Rinpoche Signal Processing Method, The Stress Measurement

Posted on:2007-01-24Degree:MasterType:Thesis
Country:ChinaCandidate:J ZhangFull Text:PDF
GTID:2192360185456403Subject:Precision instruments and machinery
Abstract/Summary:PDF Full Text Request
The operation status of equipment keeps close relation with its inner structural stress. In order to ensure security and reliability, it's necessary to monitor and evaluate the inner stress of the equipment effectively.There are several methods that are usually applied in engineering practice to examine structure stress: resistance variation method, Barkhousen noise method, X radial method and ultrasonic method, etc. With comparasion to others, the Ultrasonic method is acknowledged to be one of the most promising non-damaging inspection method in structural stress measurement filed for its fine sensitivity, veracity and good operation features.This paper presents a platform that measures the tangent stress of the elastic media using Critically Refrected Longitudinal Wave (LCR for short) based on acoustic-elasticity theory. The primary experiments are complete in general purpose stress equipment controlled by PC.This paper introduces the basic theory of stress inspection using ultrasonic at first. The mechanism of the generation of LCR wave is described in detail as well as its application. Then the hardware structure and work principle of the measurement platform based on TDC are introduced with the high precision Time to Digital Converter, TDC in brief, being described in detail. After these, the paper analyses the design and structure of control software and presents the test and data process at last.The experimental results indicate that the tangent stress keeps quite linear relation with the variation of the time in fixed transmission distance of LCR wave in elastic range. Also, the experiment results prove correctness and feasibility of the methods for measuring and processing LCR wave in stress measurement. The research provides beneficial reference for the application of tangent stress measurement in elastic media from theory to practice with TDC.
Keywords/Search Tags:tangent stress, LCR wave, AVR serials MCU, TDC
PDF Full Text Request
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