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Aerospace Grade Tantalum Chip Capacitors Resistance To Accelerated Stress Studies

Posted on:2011-09-26Degree:MasterType:Thesis
Country:ChinaCandidate:Y R PengFull Text:PDF
GTID:2192360308975683Subject:Electronics and Communications Engineering
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With the continuous improvement and development of aviation and space technology,chip tantalum electrolytic capacitors with small-size, high reliability and high performance are more widely used.For space application, space-level chip tantalum capacitors are used in aerospace environment with harsh conditions such as rapid-change temperature, low vacuum, severe radiation, high voltage stress and other extreme environmental conditions. These stresses have a great impact on the reliability of tantalum capacitors in space application. In China, because the research and development of space-application-based chip tantalum capacitors are still in the initial stage, the resistance ability to extreme environmental stress is still not completely known, it's an urgent need to establish accelerating test program and acquire the basic data of stress resistance ability of chip tantalum electrolytic.Aerospace grade chip tantalum capacitor failure rate depends on the application of three important conditions: DC voltage, ambient temperature and the circuit resistance, based on tantalum capacitor failure mechanism , Completion of thesis studies the following aspects:1,high temperature capability test;2,reverse voltage resistance test;3,resistance to temperature shock test;4,resistance to accelerating voltage test.Through the above tests, to obtain the following results:1,obtained resistance capability to thermal shock of space-level tantalum capacitors;2,obtained high temperature working ability of space-level chip tantalum capacitors;3,obtained resistance capability to acceleration voltage space-level chip tantalum capacitor;4,obtained resistance ability to reverse voltage of space-level chip tantalum capacitor.Through research, access to space-level chip tantalum capacitor capacity accelerated stress resistance, stress screening and reliability assessment system are established and improved, it can use to assess the reliability of space-level chip tantalum capacitors in long-life applications such as aviation and aerospace fields, and to provide basic reliability data for the users.
Keywords/Search Tags:space-level, Chip Tantalum Capacitors, Accelerated stress test, Extreme accelerated stress
PDF Full Text Request
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