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Measurement System Based On Cmos Image Sensor, Multi-spectral Color Temperature

Posted on:2008-01-10Degree:MasterType:Thesis
Country:ChinaCandidate:J ChenFull Text:PDF
GTID:2208360242956524Subject:Signal and Information Processing
Abstract/Summary:PDF Full Text Request
Temperature is one of the most important parameters which determine the state of thematter. The measure and control of the temperature plays an important role in the nationaldefense, military, scientific experiment and industry and agriculture production. Themulti-spectral (multi-wavelength) radiation thermometry, which can be used to measureboth the true temperature and the spectral emissivity, is based on surveys of illuminationintensity in different wavelengths simultaneously. Along with the background knowledgeof emissivity, the temperature of the illuminant could be gotten. To certain object, theimpact of emissivity can be reduced, so that better measuring precision could beobtained.In the thesis, an experimental system of multi-wavelength temperature measurewhich is based on CMOS image sensing technology is designed and realized. Thespectrum information of each instant moment was captured by each row of CMOS imagesensor (CIS), depend on the unique characteristic of its rolling shutter. After fitting ofspectrum emissivity using regressive least square method, the color temperature of theilluminant whose temperature is variable could be obtained continuously, according tothe multi-wavelength temperature measuring theory.Base on CIS's high integration of several basic functional modules in one single chipand the adoption of Complex Programmable Logic Device (CPLD) in the peripheralconfiguring and driving interface design, the system realized the fast collection ofilluminant's spectrum image. When working on its rolling shutter, the utmost spectrumcollecting periodicity of IBIS5-A-1300 (the CIS adopted in this system which wasmanufactured by FillFactory NV) was 35.5 us, which is fast enough to capture thespectrum information of the fast varying illuminant. With all the optical parameter of theexisting experimental system, the effective spectrum was from 250 nm to 750 nm, thespectrum resolution of CIS's focal plane was 0.544 nm. Based on the multi-wavelength'sillumination intensity among visible light spectrum, combine with standard color temperature light to calibrate and multi-wavelength color temperature regression analysisarithmetic, the system has successfully got the temperature of fast varying halide tungstenlight and its temperature varying curve with time.
Keywords/Search Tags:Multi-wavelength temperature measuring, CMOS image sensor(CIS), Rolling shutter, Regression analysis, CPLD(Complex Programmable Logic Device)
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