The Research And Development Of The Electrical Connectors Multi-functional Integrated Test System

With the rapid development of the electrical industry, electrical connector as an indispensable part of powered circuit is used more widely. At the same time the requirements on its performance and reliability are getting higher and higher. But the related test method and failure mechanism have been seldom studied in-depth, the related standard and test equipment is only on the individual detection of the connector, don’t consider the multi-affect between contact resistance and insertion&extraction force. The subject research is performed just based on the background.(1) Base on the electrical contact theory, the working mechanism, the failure mechanism and the influencing factors of the connector are briefly discussed. This paper also focus on the relationship between contact resistance, connector performance and the effect of the connector surface oxidation on the life span.(2) Because the functions of current connector testing equipment is inadequate, backward mode of test methods and can’t test the comprehensive performance of the electrical connector. So according to the electrical contact theory, in this paper, we use virtual instruments and embedded control technology to test the contact resistance and insertion&extraction force at the same time.(3) For supporting the function of the electrical connector testing task, computer plus embedded control is applied in this paper. We could analyze the data, display the data and store the data by the PC software which develop by LabVIEW, SQL language and support by Access database, USB communication technology. The embedded control system could acquisition the test data with high accuracy and control the servo motor by closed-loop moduleAccording to GB2099-2008and test based on household conversion plugs, we build up the test system, which can not only test the contact resistance and insertion&extraction force, but also analyze the relationship between the two specific parts of the connectors. In the meanwhile, it has completely achieved the goal of automation and computerization during the test process.