Extracting Parameters Of Photovoltaic Cell Model And Research Of Aging Fault

Solar energy resources is widely abundant as a new energy. With the gradualdevelopment of photovoltaic industry, the monitoring system and fault diagnosis ofphotovoltaic array in the photovoltaic power station are becoming more and morenecessary. At present, the researches of the fault diagnosis of photovoltaic arrays inthe domestic or foreign are almostly based on the connection structure, and faultdiagnosis methods for PV arrays can be broadly classified into those based on infraredimages and those based on electrical signals, thoughing these methods we can not leadresearch to a high level only from the external characteristics, which is difficult for usto study faults from the solar battery model with these methods.In order to study the internal mechanism and the change of model parameters ofaging solar cell, and then get a quantitative description between them. We analysedthe change of model parameters in the aging solar cell based on the semiconductorstructure and characristics and deducted the relationship between parameters and theaging of soalr cell. At last, we initially established the aging model of soalr cell. Inthis paper, we put forward a new method to quickly and accurately extract theparameters of solar cells based on self-adaptive chaos particle swarm optimizationalgorithm (SA-CPSO), which is primay and necesary for the study. Based on thiswok, this paper also extracted the parameters of simulate aging solar cells and putforward aging model throuth analysing and deducing.Finally, this paper has built the system’s hardware circuit with programmabledevice FPGA. Throuth simulating different aging state of solar cell, this paper alsorepeated many experiments with hardware system to verify that it is reliable andeffective to extract parameters of solar cells using SA-CPSO algorithm. The workalso show the deducted fault model of aging solar cell is viable and effective, thispaper provides a basis for further research and diagnosis of aging fault. what’s more,it has important engineering value in output prediction and power point trackingcontrol of PV array.