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The Production Test Analysis Of The DC-DC Module In Mobile Power Management IC Based On ATE

Posted on:2015-08-15Degree:MasterType:Thesis
Country:ChinaCandidate:H X YangFull Text:PDF
GTID:2272330464964637Subject:Software engineering
Abstract/Summary:PDF Full Text Request
In recent years, there is a rapid progress in mobile communication, the Portable mobile equipment market shows a great prosperous and devices can work much better than ever before. However, as the performance of the equipment is promoted, the power management technology plays a leading role in the research of high performance equipment. In the power management IC, because of the high efficiency of DC-DC convertor and the ability to control voltage to rise and fall, DC-DC becomes a main part in the constitution of power management IC. In modern mobile phone system, because of the widely used of IMVP technology, DC-DC that can switch voltage dynamically based on the switch of the process working frequency become a major DC-DC in Power management IC. However, there are some process drifts during production, so the output voltage of DC-DC vary a lot, in order to save production cost, we need to do production test to make more device meet the design requirement.This paper analysis DC-DC convertor operating mechanism from voltage shift mode and control principle, study the total function of power management IC, and divide the output voltage part into DC-DC module and LDO module. DC-DC module consists of three parts: PFM/PWM controller, MOS switch driver and feedback part. A voltage calibration mode was build based on the division. In order to require the production requirement, a test Loadboard which enable parallel test for 4 DC-DC modules was designed; and make an overall configuration for test channel pin, timing, level and analog sampling unit; a test flow was created and optimized; the test pattern was developed based on D2 S framework; the test data analysis program was development. Based on the setup mentioned before, the production test was executed. This test result shows that this test design can not only do the production test, but optimize the parameter of fail devices as well. This test design gives an efficiency method to promote the production yield, reduce test time and production cost.
Keywords/Search Tags:Power Management IC, ATE, DC-DC, Analog Parameter Testing
PDF Full Text Request
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