Research Of Optical Arbitrary Waveform Measurement Techniques Based On Optical-Parametric-Amplification Of XFROG

With the rapid development of optical arbitrary waveform generation technology, many complicated optical waveforms can be generated, which have important applications in many fields, including biology, medicine, materials science, optical communications, etc. Therefore, it is necessary to measure optical arbitrary waveforms accurately. Presently, the main measurement methods of optical arbitrary waveforms are dual-quadrature spectral shearing interferometry, electric-field cross-correlation technique and frequency-resolved optical gating. In comparison, FROG is a simple and effective method, which can measure the amplitude and phase of waveforms.In this paper, by using optical parametric amplification effect in nonlinear crystal, an XFROG measurement scheme for optical arbitrary waveforms based on optical parametric amplification of crystal is presented. Especially it can accurately measure weak optical arbitrary waveform. Also, the performances of the measurement scheme are studied theoretically. The main achievements and conclusions are listed as follows:(1)The theoretical basis of the XFROG measurement scheme optical for arbitrary waveforms based on optical parametric amplification of crystal is analyzed in detail. The analysis focuse on optical parametric amplification gain coefficient, optical parametric amplification crystal and phase matching. At last, an XFROG measurement system for optical arbitrary waveforms based on optical parametric-amplification of crystal is designed and the principal component generalized project used in the system is introduced.(2)With the Matlab software, the recovery algorithm of this system can be obtained and the aconvenient operation of GUI interface in MATLAB software is designed. By the simulation of XFROG measurement scheme for optical arbitrary waveforms based on optical parametric amplification of crystal, the accurate measurement of optical arbitrary waveforms can be realized, which verifies the feasibility of the measurement system.(3)The main influence factors of waveform recovery in simulation are analyed, including noise, the number of iterations, the initial guess pulse and the gate pulse shape influence on waveform recovery. Finally, through the analysis of optical parametric amplification and correlation coefficient, the measurement sensitivity of this system is studied.