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The Process Capability Analysis And Control Methods For Non-normal Processes In The Electronic Manufacturing Industry

Posted on:2017-02-21Degree:MasterType:Thesis
Country:ChinaCandidate:X Y QiaoFull Text:PDF
GTID:2272330485480196Subject:Industrial engineering
Abstract/Summary:PDF Full Text Request
Statistical process control theory is an effective theory to promote quality management development and it has made a significant contribution to continuous quality improvement. Traditional statistical process control theory is based on the assumption that quality characteristics under conditions of normal distribution. However, the quality data acquired in many manufacturing industries do not follow the normal distribution. It will lose the meaning of control to use traditional statistical process theory to control non-normal characteristic value, transfer false information and lead to defective product rate increases. Therefore, the problem of process capability analysis and control methods in non-normal processes has become an urgent issue to be solved.First of all, the paper describes the theoretical knowledge of the normal statistical control chart and process capability analysis. Combines with the characteristics of nonnormal process parameters in the production of electronic components, the technology of SPC is introduced, which lays the foundation for the following construction model.Secondly, this paper verifies the control chart effectiveness under the control of non-normal process using Skewness Correction(SC) control chart was proposed by Chan and the Scaled Weighted Variance(SWV) control chart was proposed by Castagliola, as well as the non-normal random data was generated by Minitab. In addition,under the Monte Carlo simulation method, this paper demonstrates the calculation results of five kinds of non-normal process capability using boxplot in the process capability analysis. By constructing the model of non-normal process that the Skewness Correction control chart and the calculation method of Johnson process capability, it will improve the statistical process control system. Finally, the construction model will be applied to the key process of electronic manufacturing industry—chip package, and the collected case data will be monitored by Minitab to verify the effectiveness of construction model and solve the problem of process capability analysis and control in the process of practical application. In this paper, the proposed method has important theoretical and practical significance to improve product quality.
Keywords/Search Tags:non-normal process, Monte Carlo simulation, control chart, process capability analysis
PDF Full Text Request
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