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Development Of Nondestructive Measuremental Instrument Of EED

Posted on:2017-05-08Degree:MasterType:Thesis
Country:ChinaCandidate:Z W ZhaoFull Text:PDF
GTID:2272330503458274Subject:Electronic Science and Technology
Abstract/Summary:PDF Full Text Request
As excitation system, EED are widely used in various fields such as military and civilian use, whose firing sensitivity directly determines the reliability of the equipment or system, hence it is particularly important to detect EED firing performance. The statistical methods used in previous studies makes 100 percent predictions of its combustion performance by analyzing the variations of voltage amplitude of bridge wire when EED is preheating, however, the single current waveform used in the test limits the analyzing data source. This paper introduces a design of NDT system with a variety of test current output, which will not affect the quality and performance of EED.The system adopts an overall design of "software analysis + hardware detection". With STM32 microcontroller as control core, hardware detection of this design numerically outputs three test currents of different waveform for testing sensitivity of EED by controlling current source; as acquisition core, the microcontroller is also served for acquisiting millivolt level rise voltage of EED with differential peripheral and second-order active filtering circuit. The system uses serial communication to transfer data to the PC side, whose software analysis draws waveform of the collected voltage. By using different analytical methods to make comprehensive analysis of the time domain and frequency domain of the collected voltage data, features as data and images storage are provided.This paper is divided into three parts. The first two chapters introduces the research background and object systems of Nondestructive testing system, and make a brief analysis of principles and mathematical model of the test; the third, fourth and fifth chapters, introduces the overall design of this paper, its hardware design and software design and both implementation; the last two chapters describes the actual product, test data and improvements.
Keywords/Search Tags:EED, Nondestructive testing, STM32, Constant Current Source
PDF Full Text Request
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