The Design And Application Of A Board-level Test And Fault Diagnosis Platform For System

The main research content of this paper is the integration of test and fault diagnosis platform for system, which mainly includes the following sections: overall design of test and fault diagnosis platform, design of conditioning and adapters, process TPS design. Configuration of the hardware resources of test and fault diagnosis platform to meet all the test equipment DUT testing and fault diagnosis needs; no or as few modifications to test program set(TPS) as possible to achieve a similar instrument swaps; by replacing dedicated adapter, increase or decrease in the corresponding test resources corresponding, run the correlative TPS, related to the measured object detection, has good versatility and scalability.Testing and fault diagnosis platform consists of two main parts:hardware platform and software platform. This paper is primarily research on design of hardware platform and application of software platform. The main problem that hardware platform solve is: how to build a universal testing station which resource capacity covers testing needs, and can expand expediently in the future. Mainly related to the problems of hardware resources determination, the design of independent component analysis(ICA) and the switch network, structural design. Hardware of testing and fault diagnosis platform is divided into three parts: a common platform, signal receiver and special test components. Common platform in addition to the requirements of its own power supply, supply for the device under test to provide a variety of power work needed. Common platform program to complete the test pieces of the testing process control, power supply, monitoring and control signal generation and conversion equipment manipulation. Signal receiver is used for the completion of the general equipment and DUT accurate and reliable connection necessary conversion and transmission of the signal. Special test components is used when the tested circuit board testability is poor, cannot locate the components fully automated test cases, in order to meet the special needs of the local circuit interaction testing of the DUT, in accordance with the DUT logic relations and electrical characteristics consistent with the idea developed. It’s used to implement artificial way to semi-automatic test diagnostics to complete the circuit unit on the platform. Through the work of this article, we design a testing and fault diagnosis platform with low cost, good reliability and ability of automatic test for different circuit board.