Micro-nano Characterization Techniques Based On Afm And The Application In The Study Of Physics And Electrochemical Properties Of CuO/Cu₂O Thin Films

AFM?atom force microscopy?has widely application in the semiconductor,electrochemistry,botany and microbiology field.In this dissertation,selecting the CtuO/Cu₂O films with unique nanowires structure as the research objects,we mainly focus on micro-nano characterization techniques based on AFM.The main studies contain following two respects:1.We have fabricated CuO?002?preferred orientation thin film with nano wheatear array by using reactive magnetron sputtering.Their structures were measured by XRD and SEM.The band gap variation of the films was investigated by UV-vis spectrophotometer,single nanowire electronic measurement based on conductive atomic force microscopy?C-AFM?and Kelvin probe force microscopy?KPFM?.The experimental results indicate that:?1?the as-deposited CuO films with different length from 190 nm to 500 nm have nano wheatear array and good crystallinity with preferred?002?orientation;?2?the band gaps of CuO films can be modulated from 1.54 eV to 1.25 eV by the length of nano wheatear,which is caused by quantum-confinement;?3?the decrease of the work function with increasing temperature,and the their variation?AWF?with 0.28 eV,0.25 eV,0.20 eV and 0.15 eV between 30? and 70 ? for the samples 1,2,3 and 4,reflect the p-type carrier and the value of the band gap,which can be explained by the energy band.At last,it is suggested that KPFM and C-AFM provide both effective methods in measuring the band gap of the semiconductor.2.We prepared CuO nanowires as binder free electrode films.The electrochemical properties of the as-prepared CuO nanowires were performed using coin cells?CR2025?and in-situ AFM.The experimental results indicate that the as-prepared CuO nanowires exhibit high specific capacity and excellent cycling stability,which is due to the?002?preferred orientation and the unique nanowires structure.The nanowires array structure can disperse the transverse stress induced by lithiation.We also found that the capacity loss during first discharge process was caused by electrochemical degeneration of Cu₂O mesophase.Researches based on AFM enrich the characterization techniques of electrode materials and have great practical value in lithium ion batteries.