Analysis And Improvement For The Flicker & MGT Anode Temperature Of Microwave Oven

With the growth in the living standard, the Microwave Oven has already been an important part of the necessity of citizen’s daily life. But as a product, the Microwave Oven should meet the customers’ requirement and it should meet all the regulation and standard which was published by local government continuously. Under this situation, the only way to keep the quality of Microwave Oven companies is to continuously improvement.During the development progress of Microwave oven, there are lot of problem and issues appeared, if these issues cannot been solve in time, the product quality will be heavily influenced. So the efficiency analysis method and platform is necessary for the quickly and proper improvement.This paper analysis the problem of Flicker and Anode temperature based on current product, described the cause and harm of these issues. Detailed analyzed above issues based on electromagnetic field theory and HFSS simulation system; and set up the simulation model for Microwave cavity via HFSS, export the proper solution for the issue solving, retest with the real product with the proper solution which export from HFSS system. And the validity and correctness of the optimized solution has been confirmed by the following test.Preliminary analysis the advantage and disadvantage of the Simulation system which applied to exactly issues’ solving. Laying the foot for the simulation system’ extensive application in the future.