Defect Study On Solar Panels Surface Based On Infrared Detection

The quality of solar panels have a decisive impact on the efficiency of the PV system output.When the material and the process determined,solar panels surface defects generated during the processing or construction will greatly reduce the reliability and efficiency of solar photovoltaic power generation system.While some solar panels surface defects is difficult to directly identify by naked eye,it is necessary to study on the technology of how to effectively identify surface defects.It also has theoretical and practical significance.The paper studied the theory,designed the software emulation,build the experimental platform for solar panels defects typical infrared signature under different conditions.The paper focus on the ambient temperature which is the main factor affecting the solar panels defect infrared signature.Defect study on solar panels surface based on infrared detection which the details include:First of all,according to the photovoltaic principle and the parameter model,analyze the influence that the solar panels surface defects occurred to its resistance and the temperature distribution.Through experiments to get four common surface defects resistance at the ambient temperature of 25oC.And then calculate the solar panels resistance by the mathematical relationship among the solar panels resistance,ambient temperature and the light radiation intensity at the ambient temperature of 30oC and 35oC.Next,establish the solar panels equivalent model in ansys simulation software.Equivalent method using for four common defects were simulated and get the different infrared images of the surface defects.Then analyze the four common defects of fragments,crack,broken gates and black pieces.Then,by means of the device selection,lighting design simulation program and calculation of a uniform illumination,setting up the experiment platform for solar panels defect infrared detector.Afterwards,obtain the infrared images at the temperature of 25oC,30oC,35oC respectively and analyze the character of the images.Through Hough transform to identify the defects,and then fitting a straight line,and the outline of the scanning area calculation,combined with defective temperature data of the defects to determine the type of the defect.Four common defects of photovoltaic panels are determined by image process.The paper analyzed the infrared signature of solar panels surface defect through theory and simulation.The carried out the experiment to verify the infrared signature of solar panels surface defects.The result shows that it is effective and feasible to apply infrared detection technology.