FPGA-Based Generation And Analysis Of Smart Meter Dynamic Error Excitation Test Signal

With the development of modern technology and the adaption of China’s energy structure, proportion of clean energy source in the power grid growing, the load terminal also diversified. In order to more accurately measure under the dynamic load conditions, Dynamic load excitation signal generation technology and Error measuring technology of electric energy meter under dynamic load condition has caused great concern in the field related to researchers and scholars.The current status of various types of test excitation signal and the development status of smart meter dynamic error characteristics and related Standards is introduced in this paper. It demonstrates the importance of establishing a dynamic error test excitation signal.Secondly, we depth studied of the actual dynamic load operating mode. To simulate the dynamic loads in this article built TASK (Ternary Amplitude Shift Keying) dynamic test excitation current and power signal mathematical model and given a dynamic error measurement based on TASK. We study the basic characteristics of m sequence, established m Sequence Modulation dynamic error excitation signal test model (mSM:m Sequence Modulating).Moreover we improved related hardware and corresponding microcontroller program and proposed a realization of the mSM test excitation signal and used FPGA to generate mSM dynamic test excitation signal.Finally, we design the smart meter dynamic error testing device, build the intelligent electric energy meter testing system. On this basis, we have a dynamic error test for different types of electric energy meter at home and abroad and give the test results. The Test results show that the signal model can correct the dynamic characteristics of the electric energy meter.