Development Of A Software Platform For A General Single Event Test System

Space radiation effect is one of the important factors that affect the stable operation of spacecraft devices in the universe.In order to ensure the stability and reliability of spacecraft devices in orbit,we need to simulate the single particle irradiation test on the ground.The single event effect ground simulation test of large scale digital integrated circuits is an important method to verify the reliability of electronic devices.It provides first-hand data support for solving single event effect protection.The Institute of microelectronics of original hardware platform of single particle effect test system was improved,and built a complete software testing system:firstly,test system of the original single particle effect,the test system includes a motion control system(stepping motor),motherboard test system device under test loading board,multi FPGA architecture and the PC machine with ChipScope function.The advantages of this test system is the design of a motor is installed on the test system of central control system motherboard movement,the movement drive system equipped with the chip platform motherboard rotation,increase the single chip is installed radiation area,shorten the switching time of different chip;and with the motherboard test platform for space round.Reduce the rotational motion of the maximum occupied by the system of perfect adaptation of the country face single particle simulation test equipment unit.The test system can load 8 samples at the same time,and effectively verify single chip switching(SEU)effect of all kinds of integrated circuits in the simulated ground single particle radiation environment.However,the original single particle testing system has been put into operation for a short time,and there are some problems and defects in practical application.This paper optimizes the algorithm test machine based on the original single particle test system,design a test PC interface:control the lower machine operation,receiving the next crew return test data to be displayed and stored in the document,abandoned the original manufacturer with stepper motor PC,independently developed a a new open stepper motor PC interface by using Labview software,this paper designs a feedback function;at the same time,the development of computer control FPGA of the testing process,and the two are integrated to form a perfect complete control of multi chip testing process computer system.In this paper,the objects used in this paper are selected as the semiconductor static random access memory(SRAM),which is commonly used by our space agency and is greatly influenced by the effect of the single particle effect.The test system was tested in the field of heavy ion accelerator of China Institute of Atomic Energy Institute of nuclear physics of the single particle effect device,using Ge,I,CL of 32K-SRAM(8*512k*8bits)particles were irradiated,smooth operation of test process,fast switching chip.It is proved that the SRAM turnover cross section curve of the test data is consistent with the expected result,which proves the stability and reliability of the system.