Research On The Embedded Image Processing System For The Measurement Of Silicon Geometrical Parameters

In recent years,the machine vision which has the characteristics of obiective,high-speed and non-contact measurement is widely demanded in the field of the industrial measurement.FPGA,with the advantages of programmable hardware,parallel computing,low power consumption and multi-pipeline operation,trends a new research direction in the area of machine vision.This paper builds an embedded image processing system based on the NIOSII,SOPC and image processing technology for the measurement of solar cells geometrical parameters.The embedded image processing system is divided into several functional parts.The paper intrduces the functional parts and the design of measurement algorithms of solar cells geometrical parameters in detail.Firstly,the paper designs the overall block diagram of the embedded image processing system and the system is mainly divided into three functional modules,including image acquisition,image storage and image transmission module.The paper accomplishs the construction of the system hardware platform based on FPGA technology and the design of the corresponding control interface.According to the analysis of the system,the paper completes the circuit design of each functional module.The paper builds the hardware platform based on SOPC technology in FPGA.With the call of NIOSII processor,the system realizes the task scheduling.Secondly,based on the embedded image processing system,the paper designs the measurement algorithms for solar batteries.By using image gray processing,image filter processing,image binarization processing,image feature extraction processing and image edge fitting processing,the paper has realized the geometrical measurement of solar cells.Finally,the measurement algorithms are intergrated to the embedded image processing system.Among the process of the algorithms intergration,the paper completes the image preprocessing algorithms with FPGA logic resources.And,the paper completes the gemetrical measurement of solar cells based on the NIOSII processor.By introducing the debugging process of the embedded image system,the paper shows that the system can accurately measure the geometrical parameters of solar cells.The paper also analyzes the measurement results and presents the error analysis.