Research On FPGA Performance Reliability Test Method

With the FPGA field programmable logic gate array performance indicators,requirements continue to increase,programmable logic device(FPGA,CPLD,etc.)to get a large number of applications,under the background of the application of FPGA reliability testing technique for development and wide application of programmable logic device plays a more and more important role.Firstly,for Xilinx 3 class of FPGA devices can be resource programming test technology is studied,and put forward a "divide and conquer" and "array" as the basis of test methods.On this basis,the paper puts forward an integrated circuit test system based on(ATE)FPGA online reconfiguration scheme.The implementation of the program is to test the FPGA device configuration-Test-re configuration-re test of automation,procedures.The number of test contents of reconfigurable FPGA device according to the internal logic resource is extended,and then reach for more comprehensive testing FPGA device.The FPGA device reliability testing methods and approaches can be applied to other series and models,for the programmable logic device can provide certain reference and reference programming resources testing technology.