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The Research Of Stored Testing System For Shock Wave With Programmable Multi-parameter

Posted on:2019-05-05Degree:MasterType:Thesis
Country:ChinaCandidate:F HanFull Text:PDF
GTID:2371330545491826Subject:Instrument Science and Technology
Abstract/Summary:PDF Full Text Request
This subject comes from the test requirements of blasting air shock wave of a weapon institute.In this paper,current research status of stored testing technology and the propagation characteristics of blasting air shock wave are analyzed.Combining with the indicators that given by the project,a stored testing system for shock wave with multiple programmed parameters is proposed.The general explosion shock wave testing system was designed for special applications with a narrow suitable range.In this paper,some programmable parameters have been added in this testing system,which can be flexibly set according to the measured objects demands,thereby the universal of the testing system have been enhanced.The system is composed of two parts:the testing device and the host computer software.The testing device includes sensor,signal conditioning circuit,analog-to-digital conversion circuit,storage circuit,and power management circuit.The host computer software is written by Qt,processing friendly human-computer interaction interface,and it is applicable to many platforms.Based on the previous research results,ICP pressure sensor is selected.By combination of DC coupling and numerically controlled voltage level shifting,the effect on the sensor low frequency characteristic is eliminated with the bias voltage eliminated simultaneously.The design for the analog circuit is improved with several programmable parameters added,it owned a wide range of programmable amplification,programmable baseline and programmable filter cutoff frequency.The core controller adopts a single FPGA chip and does not need to cooperates with other controllers to set parameters such as analog parameters,negative delay length,sampling time,sampling frequency,rigger threshold,low power consumption length,and control the analog-digital conversion circuit,nonvolatile memory circuit and interface circuit work normally.Through the measures of encapsulation,NAND Flash management and negative delay to guarantee the testing system to obtain a complete shock wave test curve.The reliability and validity of the proposed system with the programmable multi-parameter technology is verified by applying in actual measurement experiments,this system obtained the overpressure curves changed over time in a harsh environment of high temperature,strong light intensity and electromagnetic field caused by the exploded ammunition.
Keywords/Search Tags:Shock wave, Storage test, Programmable multi-parameter, Low frequency characteristics, Non-volatile storage
PDF Full Text Request
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