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Study Of Deposition Technique Of TiVN Thin Films By Plasma Enhanced Magnetron Sputtering

Posted on:2020-10-09Degree:MasterType:Thesis
Country:ChinaCandidate:Q XieFull Text:PDF
GTID:2381330575978227Subject:Mechanical engineering
Abstract/Summary:PDF Full Text Request
Plasma enhanced magnetron sputtering?PEMS?greatly increases the ionization rate of conventional magnetron sputtering,which is beneficial to obtain the films with good compactness,excellent mechanical properties and low residual stress.In order to further improve the mechanical properties and tribological performance of TiVN thin films,the influence of substrate bias current?Is?on the microstructure and properties of the TiN films deposited by plasma enhanced magnetron sputtering,as well as the effect of the V content on the properties of TiVN thin films was studied.It was shown that TiN films with a nearly stoichiometric composition are produced in the whole range of Is.With the increase of Is from 0.1 to 3.0 A,the microstructure of the films is transformed from a loose columnar microstructure into a denser and featureless microstructure.TiN films deposited at the whole range of Is show the preferred orientation of TiN?111?.The grain size of the films is abruptly decreased from44 to 11 nm with Is increased from 0.1 to 1.5 A,but the effect of Is on the grain size becomes unobvious when Is is above 1.5 A.As Is is increased from 0.1 to 1.5 A,the hardness and effective Young's modulus of the films are significantly improved while LC1 is decreased;but when Is is further increased,the mechanical properties and LC1stays essentially unchanged;however,LC2 is decreased as Is increases from 0.1 to 6.0A.When Is increased from 0.1 to 3.0 A,the wear rate of the TiN-coated samples is distinctly decreased to 9.4×10-16 m3/?N·m?;however,the wear rate is gradually increased with further increasing Is.The Ti1-xVxN films prepared by PEMS shows a dense micro structure in the whole range of V content;and the compactness of Ti1-xVxN films shows little dependence on the V doping content,as x increases in films.When x increases from 0 to 1,the deposition rate is first increased and then decreased.All Ti1-xVx N films exhibits B1-NaCl structure and with increasing x,the intensities of?111?peak and?200?peak are gradually decreased while that of?311?peak is increased gradually.As x is increased from 0 to 0.71,the hardness,Young's modulus and brittleness of the TiN film increase first and then decrease;but further increasing x,the mechanical properties of the film change little.As x increases from 0 to 0.61,the wear rate of Ti1-xVxN film samples is fluctuated slightly,all better than 2.1×10-15 m3/?N·m?;however,the continued increase of x leads to a gradual increase in the wear rate of the Ti1-xVxN-coated samples.
Keywords/Search Tags:plasma-enhanced magnetron sputtering, TiN-based films, substrate bias current, V content, tribological properties
PDF Full Text Request
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