| At present,the safety level of nuclear power equipment in China needs to complete the identification test to verify whether the engineering prototype index meets the requirements.The EMC test is an important one in the identification test.Due to the insufficient attention paid to the EMC design of the equipment,it is often necessary to make special rectification after the EMC test.Besides,transient immunity test does great harm to the equipment in question.It often occurs that components in the equipment are burned out during the test,which increases the complexity of analyzing and rectifying the equipment’s immunity.Therefore,it is of great significance to study the whole process of transient immunity analysis and rectification of electronic equipment in nuclear power plants.This article main work includes: firstly analyzed the energy characteristics of transient interference sources and coupling of the transient interference ways,and from the angle of the usage and the simulation of transient interference suppression device is introduced,a simulation model selection and at the same time mentioned specification using multistage protection circuit of transient interference suppression devices,set up the main points of the circuit design and PCB design.Then according to the present of electronic equipment transient analysis and corrective actions systemic immunity is not strong enough and comprehensively the status quo,in view of Electro Static Discharge(ESD)transient immunity test,Electrical Fast Transient(EFT)immunity test,SURGE transient immunity test of the three transient immunity test,through the adoption of problem oriented principle,puts forward the problems check list and position and point of view,and based on the thinking of problem oriented,gives a more complete electronic equipment transient immunity problem rectification process.The rectification process proposed in this paper was applied to solve the problem of transient disturbance immunity of an electronic device in a nuclear power plant.The basic information of the device was collected,the disturbance immunity of the device and the design and analysis of safety regulations were completed,and the rectification scheme for the problem of transient disturbance immunity of the electronic device was proposed.The solution of the contradiction between surge protection and dielectric strength test is put forward in the rectification stage,and the test circuit composed of generator,coupling network and protective device in PSPICE surge test is simulated and verified.The protection effect of the protection circuit in surge immunity test can be observed and the reliability of the protection circuit is verified.The experimental results were observed at the design stage.In this paper,the rectification process of the transient immunity problem was applied to an electronic device in a nuclear power plant,and the overall transient immunity problem was rectified,and the transient immunity test was successfully passed. |