Research On Accelerated Storage Degradation Test Of Metalized Polyester Capacitor

Modern weapons and equipment are in storage for a long time.In order to ensure their stable operation during service,the components or components in weapons and equipment must have high storage reliability.Metallized polyester capacitors are widely used due to their excellent characteristics such as high insulation resistance,low dielectric loss,and voltage and impact resistance.At present,in the accelerated storage degradation test and reliability evaluation research of capacitors and other components,there are still problems such as unclear degradation sensitive parameters,large errors in consistency inspection of accelerated degradation failure mechanism,and lack of basis for formulating accelerated degradation test plans.This paper takes the metallized polyester capacitor in a certain type of rolling electronic module as the object to carry out research on the determination of its storage degradation sensitivity parameters,the identification of the consistency of the failure mechanism and the optimization design of the accelerated test.First,analysis of sensitive parameters for accelerated storage of metalized polyester capacitors.By establishing the electronic stand-alone EDA simulation model and performing the sensitivity analysis of the output of the metallized polyester capacitor characteristic parameters on the stand-alone output,the degree of influence of the changes in the characteristic parameters of the metalized polyester capacitor on the output characteristic parameters of the electronic stand-alone is studied.Based on the sensitivity analysis results of the characteristic parameters of the metallized polyester capacitors,a bottom-up test program is developed to measure the degradation data of the characteristic parameters of the metalized polyester capacitors,analyze the degradation of different characteristic parameters,and finally determine the sensitive parameters of the accelerated storage of the metalized polyester capacitors.Secondly,the consistency judgment of accelerated storage degradation failure mechanism of metallized polyester capacitors is conducted.Based on the metallized polyester capacitors storing sensitive parameter degradation data under different stresses during the bottom-up test,Wiener process identification and degradation modeling are performed.Based on the assumptions in the failure activation energy invariance method,sufficient and necessary conditions are obtained to keep the accelerated degradation failure mechanism consistent.The consistency criterion of accelerated degradation failure mechanism,and then determine the stress interval of the metallized polyester capacitor accelerated degradation failure mechanism to keep consistent.Then,carry out stepped stress accelerated storage test design and reliability evaluation of metallized polyester capacitors.With test funds as constraints and the goal of improving the model parameter estimation accuracy,determine the optimal objective function,the sample size,measurement time interval,total test duration,test duration under each test stress,etc.For the accelerated storage test of metalized polyester capacitors,the parameters are optimized and the accelerated storage degradation test plan is given.Based on the degradation data obtained from the experiment,the Wiener process is used to estimate the storage degradation model parameters and reliability modeling of the metalized polyester capacitor,and the storage degradation function and reliability function are given to complete the storage reliability evaluation.Finally,the test and analysis system for the sensitive parameters of accelerated storage of metalized polyester capacitors are designed.We carry out the hardware design of the test and analysis system,including the design of contact switching circuit,control circuit,component placement circuit,measurement system and intelligent alarm system.We carry out the software design of the test and analysis system through formulating the communication protocol with the control circuit of the lower computer and studying the human-computer interaction interface design and interface design of the upper computer.It realizes the test temperature and test parameter setting,test start and stop and reset control,data collection reception,document storage and other functions.