Research And Mplementation Of Transistor Parameter Measurement System

With the With increasing competition in the semiconductor industry in the 21 st century,related industries are considering obtaining low-cost,high-quality semiconductor devices.The diversified semiconductor market demand in this industry has led to an increase in the variety of performance parameter tests for various types of semiconductor devices;as the number of types of tests increases,the time spent for testing increases,especially in the aerospace and military industries.Performance parameter testing under extreme conditions,the test items are increased from the initial normal temperature condition test parameters to extreme condition test parameters(high temperature resistance test,high pressure resistance test,low pressure resistance test).Therefore,traditional measurement methods can no longer meet the needs of enterprises to save test costs.In order to solve the above problems,this paper improves the existing semiconductor device test system and adds new test requirements to the test system,which saves the cost of transformation and does not increase the measurement time.This paper analyzes the measurement principles and methods of the traditional tester,finds out the shortcomings and defects of the traditional tester,and makes improvements and optimizations.The main contents of the article are:1.The current test method of semiconductor transistors is difficult to meet the measurement of Business needs.This article designs a transistor tester,that can meet the current market demand,complete functions,and Minimum current identification can be accurate to PA level.2.The designed solution can solve the problem that the traditional tester is prone to self-oscillation during the test,change the power supply mode of the collector.In the withstand voltage test,the traditional pulse voltage excitation source is changed to use slope control to apply voltage excitation source.The advantage is that the voltage can be quickly stabilized near the set value,the preset value stabilization speed is accelerated,and the test time is shortened.3.Study the connection performance of the jack of the semiconductor transistor to be tested.Using relays and shielded wires can effectively reduce the impact of electromagnetic interference.After the project design was completed,the tester was parameter debugged and error calibrated.Finally,a variety of transistors were actually measured,proving that the design system can work safely and stably.The newly designed triode tester eliminates the phenomenon that the traditional tester is prone to self-oscillation during the measurement process..The high-voltage source is generated by the chip adjusting PWM signal to achieve the output voltage range,the applied voltage error range and the excitation.The PGA204 high-gain low-temperature drift is used to improve the measurement accuracy during data acquisition.The current test accuracy is in-mode Before the digital conversion,the optocoupler device HCPL-0211 was used to reduce the interference during signal transmission,and a clamp protection circuit was also designed to prevent the device from being burned and improve the safety of the test system.