Development Of FPGA-based Digital IC Logic Function Tester

Logic function testing is an important link in integrated circuit testing.Electronic products are gradually trending toward miniaturization,which inevitably increases the complexity of chip functional testing.In order to improve the reliability of chip test,the digital IC logic function detection device based on FPGA is studied in this paper.The paper uses the memory response method to integrate digital oscilloscopes,logic analyzers and other functions into the logic function tester,realizing the miniaturization of the test system.In the design process,the problem of IO port level mismatch is solved,and the test pins are dynamically configurable.After reading the test vectors,the format codes and logic functions are compared within the FPGA,and finally the test results are returned to STM32 for display.Tests show that the logic function tester is stable and can be used to verify the logic function of digital chips within 24 channels.Each channel works synchronously with a maximum storage depth of 64 K.Using pipeline technology,the test speed reaches 10 MHz,and the overall power consumption is less than 10 W,the standby time of the system is about 2.2 h.At a lower cost,a portable,high-reliability,and highly scalable digital IC test instrument is realized.