The effect of silicon (Si) substitution on the structural properties of hydroxyapatite (HAp) is investigated with powder x-ray and neutron diffraction methods. For this purpose, a series of samples of pure hydroxyapatite and 0.4 wt % Si substituted hydroxyapatite were prepared following a precipitation method.; Phase identification from x-ray powder diffraction measurements showed a single hydroxyapatite phase in all the samples. Powder neutron diffraction patterns from room temperature down to 15 K are analyzed using the Rietveld method. The refined lattice constants, interatomic distances and isotropic atomic displacement parameters as a function of temperature for the pure and substituted hydroxyapatite are compared. |