A versatile, multimode scanning probe microscope

The superior resolution capability of scanning probe microscopy (SPM) makes it an ideal tool for investigations beyond the diffraction limit of ordinary optical microscopy. We have designed and built a scanning probe microscope that combines atomic force microscopy (AFM), near field scanning optical microscopy (NSOM) and scanning tunnelling microscopy (STM) with simultaneous optical far field detection. The simultaneous use of AFM and NSOM or STM and optical detection has potential applications in molecular biology and biophysics.