The reliable and accurate evaluation of the key characteristic parameters of shock wave is the premise and basis for military action planning.The test results can provide a reference for warhead design and an effective basis for the development and manufacture of weapon missile materials.In recent years,with the breakthrough achievements of integrated electronic technology and software system,shock wave test technology has achieved stable development.Based on the existing research,this paper develops a set of shock wave overpressure test system with FPGA + DSP as the dual core according to the signal characteristics of shock wave overpressure during explosion.The system has fast acquisition speed and large storage capacity,and the corresponding hardware circuit and software program of the system are designed.The shock wave overpressure test system is designed by modular thinking.Combined with the requirements of the system for data processing speed,AD9238 chip is selected as the analog signal acquisition device.The main core of the system is FPGA and DSP.The main function of FPGA is to control the A/D module for dual-channel data conversion,and the collected data is transmitted to the host computer through gigabit Ethernet in real time.DSP is used as the core of data calculation.The data collected in FPGA is read through the UPP bus interface and processed.The processed data can be stored in SD card or exported to the host computer through USB2.0 and other peripheral interfaces.Finally,the high-speed measurement and output function of analog signals can be realized.After the completion of the hardware and software design of the system,the designed system is tested by each sub-module,and the feasibility is verified.After the overall test is carried out,the accurate experimental results are obtained.It shows that the system can complete the collection of shock wave overpressure signals,and has strong data processing,storage and transmission capabilities.The system can be used not only for shock wave signal acquisition,but also for many high-speed data acquisition fields. |