Design Of Battery Management Chip Test System Based On LabVIEW

In the process of lithium-ion battery application,battery management system(Battery Management System,BMS)is indispensable.As the core of the battery management system,the battery management chip can monitor and protect the lithium-ion battery,and its performance has a direct impact on the entire system.In order to prevent defective chips from being applied to the battery management system,a chip test system needs to be developed to test the chips before they go on the market.This article develops a chip test system for a battery management chip compatible with BQ76930,which can perform effective functional testing and multiple parameter reading tests on the chip under test.First,the functions,parameters and characteristics of each subsystem of the chip to be tested are analyzed in detail,the circuit diagram of the hardware test platform and the PCB layout are drawn,and the design and production of the test board are completed.Secondly,the STM32F103 is used as the main control chip(MCU)in the communication module design,which communicates with the battery management chip under test through the I~2C port,analyzes the I~2C communication protocol in detail,and designs the communication program according to the internal register structure and read-write characteristics of the chip.Finally,the laboratory virtual instrument engineering platform(LabVIEW)is used to develop the software test platform and test vectors.The software test platform uses event state machine design mode and producer/consumer design mode to improve the applicability of program operation,realizes single test and continuous test,real-time collection and display of test data,storage of test data and other functions.A battery management chip test experimental platform was built,the hardware and software test platform of the chip were jointly debugged,and the system under test was used to test the chip under test.The test results show that the test system designed in this paper can realize the tests that the chip under test needs to complete,including the test of the three key functions of the chip under test,monitoring,protection and control.The voltage value monitored in the test data is accurate to 6 digits after the decimal point and the data error is less than 5m V,the current error collected by the system is less than 0.1m A,the internal temperature test error of the chip is less than 1℃,and the voltage collection error of the external thermistor both ends of the chip is less than 10m V.The test system has a friendly human-computer interaction interface,which simplifies the tedious test operation and test process,and improves the test quality and test efficiency of the chip.