Development Of Visual Chip Automatic Test System

As a kind of miniature electronic device or component,Integrated circuit(IC)plays an irreplaceable role in modern electronic equipment.Nowadays with the rapid development of electronic design technology,ICs are constantly updated at extremely high frequencies.As an important part of the IC industry,the development of IC test technology is also placed increasing expectations on IC design and manufacturing companies.The rapid development of IC test technology can guarantee the quality and performance of chips to a great extent.The traditional IC test methods have very obvious limitations,which can no longer meet the needs of large-scale,high integration and multi-function chip performance testing.At present,there are many types of chips on the market,their packages and testing needs are diverse from each other,few test systems are capable of meeting all the requirements of custom chip with specific functions.For this reason,the development of automatic test system for customized special chips have high application value and economic benefits.Aiming at the customized chip SCM610,this paper designs a set of chip visual automatic test system to realize the measurement of chip power consumption,GPIO pins input and output characteristics,interrupt trigger,and working voltage.The system can automatically process the measurement data and generate corresponding test reports.The actual test shows that the automatic test system developed for the customized chip SCM610 can meet the needs of batch test of the chip in the actual environment.The main work in this paper is as follows:(1)On the basis of the overview of the commonly used IC automatic test technology and the analysis of the system requirements,and combined with the actual project requirements,the cooperative working mode of the upper and lower computer which takes Modbus communication protocol as the data transmission mode is determined,the overall scheme of the system is designed,and carried out a feasibility analysis.(2)Based on the Modbus standard protocol and the actual needs of the system,the Modbus information frame structure suitable for communication between the upper and lower computers of the system is customized(3)Based on the overall design scheme,the software environment and hardware platform required by the system are selected,the software and hardware design of the automatic test system was completed,and a complete set of customized chip test systems was established.(4)Verified the test function and error handling mechanism of the development system.