Design Of Chip Test System Based On PLC And MS7000

In recent years,with the start of the trade war between the US and China,domestic semiconductor demanders have been looking for domestic substitution,forcing China's IC industry to accelerate its development.Semiconductor testing is an essential part of IC development.Due to the need to improve testing efficiency and reduce testing costs,making the price of domestic chips more competitive,semiconductor testing companies are increasingly demanding domestic semiconductor testers.More and more design companies are expecting to find a set of automated test platforms that can be applied to various packages as a way to meet various functions and packages of chip testing.Based on the needs of the intern company for automated chip testing,a chip automation test platform based on the M7000 combined with a PLC was designed.Firstly,a fully mechanised chip inlet and outlet platform based on PLC was designed for chip inlet and outlet and product sorting.The system automates batch feeding and sorting after testing.A test solution based on the MS7000 was designed for an isolated chip(NSI3192)manufactured by the company.The solution includes DC parameters and functional tests for this isolated chip.The test solution was designed based on the performance parameters of the chip,and then the test machine resources were allocated to draw the schematic diagram and PCB board for the test based on the chip test solution.The overall test system was assembled,the hardware and software interfaced,and the chip tested.Secondly,in actual production,due to the manufacturing process,the internal reference voltage module of the chip will have certain deviations,and the test needs to write trim code to control the internal circuit of the chip and fine-tune the parameters of the chip.This paper improves the OTP(One Time Programmable)burn-in algorithm with the MS7000 test platform to improve test yields.Finally,based on the chip automation test system designed to test the parameters of this isolated chip,test data is obtained and the data obtained from the chip test is analysed using MINITAB software tools to draw histograms and Gaussian distributions to ensure the reliability of the chip test from the perspective of mass production.The results of the test data were analysed after small batch testing.From the test results,the chip automation test platform based on the M7000 combined with PLC can fully satisfy the chip parameters test,improve the test efficiency and yield,and greatly reduce the test cost.