Research On Electron Microscopic Image Processing Technology Based On FPGA

Due to the wide use of spherical correction,the resolution power of electron microscopes has been significantly improved,enabling researchers to study the relationship between the structure and physical properties of materials at the atomic scale through electron microscopic images.In this paper,atomic position detection of electron microscopy images is realized,which is very helpful to accurately understand the structure and strain of materials.In this paper,the centroid method and Gaussian fitting method,which are often used for quantitative measurement of atomic position,are studied.On the basis of theoretical verification and comparative analysis of the above methods,the above two algorithms are improved to be suitable for FPGA implementation.Two atomic position detection algorithm modules are designed by using the improved squared weighted centroid method and Gaussian fitting method as the atomic position detection algorithm,and using FPGA as the field programmable logic gate array based on lookup table.The obtained data are processed in parallel through FPGA,which greatly improves the processing speed and achieves the purpose of real-time image processing.At the same time,based on the atomic position detection algorithm module,this paper designs related functional modules,and completes the design of an atomic position detection image processing system based on FPGA optimization.In addition,on the basis of the image processing system of atomic position detection,the corresponding image data is calculated by taking the gold atomic image as an example,and the Angle between the atomic distance and the crystal plane in the direction of the gold atomic image is determined.This paper provides a new scheme to help researchers obtain material information,and shows that the system has good scalability and broad development prospect.The experimental results show that this method has a good effect on atomic position detection,greatly improves the calculation efficiency of related parameters,and has a broad application prospect and obvious practical significance.