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Design And Implementation Of A Magnetic Storage Testing System

Posted on:2024-06-04Degree:MasterType:Thesis
Country:ChinaCandidate:Y F ChenFull Text:PDF
GTID:2568307079466614Subject:Electronic information
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In recent years,the output value of memory chips has accounted for one-third of the entire integrated circuit industry.As an important part of the industry,researchers have been looking for new high-performance memory solutions.With the progress of research,a new type of material,magnetic random access memory(MRAM),has emerged,which can simultaneously meet the demands for large storage capacity and fast operation speeds.In theory,MRAM can be scaled down to advanced manufacturing processes and has nonvolatile characteristics,making it a hot research topic in the field of new memory technologies.Integrated circuit testing is a critical part of the entire production process and plays a crucial role in ensuring product quality and performance.Finished chips must pass testing before entering the market,while chips under development must undergo testing to ensure they meet design specifications.Through iterative testing and design improvements,chips can be refined until they reach final form.This article focuses on the design and implementation of a small-scale MRAM testing system for our research group’s independently developed new MRAM chip.The goal is to test and verify the functional correctness and parameter indicators of the MRAM chip under development,help developers identify problems,and assist in iterative chip development to accelerate the completion of the project.The article first analyzes the working principle,fault models,and testing algorithms of MRAM chips and,based on the our research group’s testing requirements for MRAM chips,determines the main architecture of the testing system.The system consists of software and hardware components.The software includes an upper computer and a lower computer.The lower computer,with its advantages of having multiple pins,high speed,and reprogrammability using FPGA technology,serves as the core control component of the testing system.The upper computer,using the Python programming language,is designed to automate and visualize the testing system,utilizing its ability to call numerous third-party libraries.The upper and lower computers communicate using a USB 2.0communication chip.The hardware components consist of a mainboard and an adapter board,which includes the necessary chips and peripheral circuits.The adapter board is used to place the MRAM chip and its test seat.After completing the design and implementation of the testing system,the system is used to test the MRAM chip and verify its functional correctness and parameter indicators.In the long run,the work of this thesis provides reference significance for the design of subsequent magnetic memory test systems.
Keywords/Search Tags:MRAM, Integrated Circuit Test, Test System
PDF Full Text Request
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